<div class="gmail_quote"><br><br><u></u>
<div bgcolor="#e3e3e3" link="#003399" vlink="#660000">
<table width="600" border="0" align="center" cellpadding="4">
<tbody><tr>
<td align="right"><font size="1" face="Verdana, Arial, Helvetica, sans-serif"><a href="http://mwjournalemails.com/portal/public/ViewCommInBrowser.jsp?Sv4%2BeOSSucyBSGlYDa3ngAStLkXhghqAyNtSYJUQG8ibtTYtXiOhh%2FHhzKZpAebTEE7yk4Hln%2FBZM871Qr6Nsg%3D%3DA" target="_blank">View in Browser</a> / <a href="http://mwjournalemails.com/portal/wts/cgmcoAaOrVybaSEUqieUD0bhm7nRa" target="_blank">View on Mobile</a></font></td>
</tr>
</tbody></table>
<table width="600" border="0" align="center" cellpadding="0" cellspacing="0">
<tbody><tr>
<td><a href="http://mwjournalemails.com/portal/wts/cgmcoAaOrVybaSEUqieUD7bhm7nRa" target="_blank"><img src="http://www.microwavejournal.com/ext/resources/Webinars/2012/webinar-agilent-3-13-12-600x125px.jpg" alt="Agilent Technologies" width="600" height="126" border="1"></a></td>
</tr>
</tbody></table>
<table width="600" border="1" align="center" cellpadding="0" cellspacing="0">
<tbody><tr>
<td width="1" align="left" valign="top" bgcolor="#000000"><img src="http://www.microwavejournal.com/ext/resources/images/Newsletters/spacer.gif" alt="" height="1" width="1" border="0"></td>
<td width="600" align="left" valign="top" bgcolor="#FFFFFF"><table width="550" border="0" align="center" cellpadding="3" cellspacing="3">
<tbody><tr>
<td colspan="2"><font face="Verdana, Arial, Helvetica, sans-serif"><strong>Innovations in Network Analysis Webcast Series</strong></font></td>
</tr>
<tr>
<td colspan="2"><font face="Verdana, Arial, Helvetica, sans-serif"><strong>Title: <a href="http://mwjournalemails.com/portal/wts/cgmcoAaOrVybaSEUqieUD8bhm7nRa" target="_blank">Basics of RF Amplifier Test with the Vector Network Analyzer</a></strong></font></td>
</tr>
<tr>
<td colspan="2"><p><font face="Verdana, Arial, Helvetica, sans-serif"><strong>Date:</strong> March 13, 2012<br>
<strong>Time:</strong> 10 AM PT/ 1 PM ET/ 5 PM UTC<br>
<strong>Presented by:</strong> Agilent Technologies<br>
<strong>Presenter:</strong> Takuya Hirato, <em>Product Marketing Engineer</em>, Agilent Technologies</font></p></td>
</tr>
<tr>
<td width="403" align="left" valign="top"><p><font face="Verdana, Arial, Helvetica, sans-serif"><strong>Webcast Description:</strong><br><br>
Characterizing the fundamental performance of RF amplifiers is a critical stage in the research and manufacturing test environments. The amplifiers must meet strict specifications in order that the systems can comply with regulations for industries. </font>
</p><p><font face="Verdana, Arial, Helvetica, sans-serif">This presentation describes how to perform efficient and accurate measurements for RF amplifiers with the modern vector network analyzer (VNA). It especially highlights leveling features for accurate characterization of power-dependent active components. The presentation also discusses optimizing test systems for easy and fast amplifier measurements with the VNA's capabilities. <br>
<br>
<strong>Who should view this webcast:</strong></font>
<font face="Verdana, Arial, Helvetica, sans-serif"></font></p><ul><font face="Verdana, Arial, Helvetica, sans-serif">
<li>Engineers making basic measurements of RF amplifiers such as S-parameters, gain compression, harmonic distortions or pulsed-RF in communication or aerospace & defense industries. </li>
<li>Test system designers trying to optimize tradeoffs between the system cost, speed and measurement accuracy.</li></font></ul><font face="Verdana, Arial, Helvetica, sans-serif">
</font><br>
<p align="center"><font face="Verdana, Arial, Helvetica, sans-serif"><a href="http://mwjournalemails.com/portal/wts/cgmcoAaOrVybaSEUqieUD9bhm7nRa" target="_blank"><strong>Register Here</strong></a></font>
</p><br>
<p align="center"><font face="Verdana, Arial, Helvetica, sans-serif">Presented by:</font><br>
<img src="http://www.microwavejournal.com/ext/resources/images/Client_Logos/Agilent-logo-300x58.gif" alt="Agilent Technologies" border="0"></p><br>
<p align="left"><span style="font-family:Verdana,Arial,Helvetica,sans-serif;font-size:10px"><strong>Takuya Hirato</strong> is a Product Marketing Engineer for Agilent Technologies' component test division. He started his carrier in R&D of Agilent Technologies in 2001. Since 2007, he has been a Product Marketing Engineer for Agilent ENA series network analyzers, in his role in application development of component test with the network analyzers.</span></p>
<p align="left"> </p><p></p><p></p></td>
<td width="120" align="center" valign="top"><table width="90" border="0" align="center" cellpadding="3" cellspacing="3">
<tbody><tr>
<td><img src="http://www.microwavejournal.com/ext/resources/Webinars/2012/PHOTO-HiratoT-100x155.gif" alt="Takuya Hirato" width="100" height="155" hspace="3" vspace="3" border="1" align="left"></td>
</tr>
<tr>
<td align="center"><font size="1" face="Verdana, Arial, Helvetica, sans-serif"><strong>Takuya Hirato</strong>, <em>Product Marketing Engineer,</em><br>Agilent Technologies</font></td>
</tr>
</tbody></table>
<p> </p></td>
</tr>
</tbody></table>
</td>
<td width="1" align="left" valign="top" bgcolor="#000000"><img src="http://www.microwavejournal.com/ext/resources/images/Newsletters/spacer.gif" alt="" height="1" width="1" border="0"></td>
</tr>
</tbody></table>
<br><br></div><div bgcolor="#e3e3e3" link="#003399" vlink="#660000"><font face="verdana, arial, helvetica, sans-serif" size="1">73's</font></div><div bgcolor="#e3e3e3" link="#003399" vlink="#660000">João Condeço</div>
<div bgcolor="#e3e3e3" link="#003399" vlink="#660000">CT2HPM<img height="1" width="1" border="0" src="http://mwjournalemails.com/portal/wts/cgmcoAaOrVybbhm7nRa.gif">
</div>
</div><br>