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<td colspan="2"><font face="Verdana, Arial, Helvetica, sans-serif"><b>Innovations in Network Analysis Webcast Series</b></font></td>
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<td colspan="2"><font face="Verdana, Arial, Helvetica, sans-serif"><b>Title: <a href="http://mwjournalemails.com/portal/wts/cgmcoAaOfTybaSzNuhByyybfqrnDa" target="_blank">Basics of RF Amplifier Test with the Vector Network Analyzer</a></b></font></td>
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<td colspan="2"><p><font face="Verdana, Arial, Helvetica, sans-serif"><b>Date:</b> March 13, 2012<br>
<b>Time:</b> 10 AM PT/ 1 PM ET/ 5 PM UTC<br>
<b>Presented by:</b> Agilent Technologies<br>
<b>Presenter:</b> Takuya Hirato, <i>Product Marketing Engineer</i>, Agilent Technologies</font></p></td>
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<td align="left" valign="top" width="403"><p><font face="Verdana, Arial, Helvetica, sans-serif"><b>Webcast Description:</b><br><br>
Characterizing the fundamental performance of RF amplifiers is a critical stage in the research and manufacturing test environments. The amplifiers must meet strict specifications in order that the systems can comply with regulations for industries. </font>
</p><p><font face="Verdana, Arial, Helvetica, sans-serif">This presentation describes how to perform efficient and accurate measurements for RF amplifiers with the modern vector network analyzer (VNA). It especially highlights leveling features for accurate characterization of power-dependent active components. The presentation also discusses optimizing test systems for easy and fast amplifier measurements with the VNA's capabilities. <br>
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<b>Who should view this webcast:</b></font>
<font face="Verdana, Arial, Helvetica, sans-serif"></font></p><ul><font face="Verdana, Arial, Helvetica, sans-serif">
<li>Engineers making basic measurements of RF amplifiers such as S-parameters, gain compression, harmonic distortions or pulsed-RF in communication or aerospace & defense industries. </li>
<li>Test system designers trying to optimize tradeoffs between the system cost, speed and measurement accuracy.</li></font></ul><font face="Verdana, Arial, Helvetica, sans-serif">
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<p align="center"><font face="Verdana, Arial, Helvetica, sans-serif">Presented by:</font><br>
<img src="http://www.microwavejournal.com/ext/resources/images/Client_Logos/Agilent-logo-300x58.gif" alt="Agilent Technologies" border="0"></p><br>
<p align="left"><span style="font-family:Verdana,Arial,Helvetica,sans-serif;font-size:10px"><b>Takuya Hirato</b> is a Product Marketing Engineer for Agilent Technologies' component test division. He started his carrier in R&D of Agilent Technologies in 2001. Since 2007, he has been a Product Marketing Engineer for Agilent ENA series network analyzers, in his role in application development of component test with the network analyzers.</span></p>
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<td><img src="http://www.microwavejournal.com/ext/resources/Webinars/2012/PHOTO-HiratoT-100x155.gif" alt="Takuya Hirato" align="left" border="1" height="155" hspace="3" vspace="3" width="100"></td>
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<td align="center"><font face="Verdana, Arial, Helvetica, sans-serif" size="1"><b>Takuya Hirato</b>, <i>Product Marketing Engineer,</i><br>Agilent Technologies</font></td>
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